Fiber-Based White-Light Interferometry for Nanoscale Distance Measurement and Control

Aram Lee,Baigang Zhang,Cheng Ma,Anbo Wang,Yong Xu
DOI: https://doi.org/10.1109/lpt.2012.2223206
IF: 2.6
2012-01-01
IEEE Photonics Technology Letters
Abstract:We present a fiber-based white-light interferometry system capable of nanoscale distance measurement and control. Our prototype contains two cleaved single mode fibers tightly clamped together. Using a supercontinuum white-light source, we can achieve distance control with a standard deviation of <4 nm. This method is potentially suitable for applications that require noncontact measurements or that involve highly deformable structures.
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