Developed Wavelength Scanning Interferometry and Its Application for Distance Measurement

Y Wang,YB Liao,Q Tian,EY Zhang,M Zhang
DOI: https://doi.org/10.1117/12.316974
1998-01-01
Abstract:A developed wavelength scanning fiber-optic interferometry has been studied in this paper. Using this method for distance/displacement measurement, we adopt a tunable external cavity semiconductor laser to simultaneously illuminate two Fabry-Perot interferometers, one as the sensing interferometer, the other as the reference interferometry. We analyze the characteristics of the scanning source and the interferometric signals, then illustrate the limitation of the measurement accuracy and resolution in terms of theory. The experimental results show that the accuracy of 0.05 micrometers and resolution of 0.01 micrometers are achieved, in the range of 1 mm.
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