Abstract:In advanced technology nodes, large timing margins must be added to allow for worse process, voltage, temperature, and aging variations. The error detection and correction (EDAC) technique effectively eliminates these margins by timing speculation, but the high design complexity and large hardware cost make many existing EDAC systems unsuitable for commercial processors. Based on the instruction-level locality of timing errors, a collaborative EDAC approach is proposed to address this issue. The hardware layer adopts simple and low cost EDAC circuits to ensure correct operation when timing error occurs, while a runtime software layer prevents recurring errors of the same instruction by sending timing error alarms to the hardware layer. Cooperation of both layers, accompanied with the proposed profile-guided timing error avoidance algorithm, eliminates more than 95% of errors with small runtime overhead. This significantly improves overall performance and alleviates pressure on the EDAC circuits. Experimental results based on the three-stage commercial CK802 processor in SMIC 40LL process present that the approach has improved the peak performance of the baseline EDAC system (Razor-Lite + half-frequency replay) by 8% and reduced the energy consumption by 25%, with less than 1.4% area overhead.

A Functional Enhancement Methodology to JTAG Controller in Complex SOC

JTAG-based Reconfigurable Method of Fast Flash Programming

Accelerating RTL Quality Assessment Method Based on CAD Tools

A SOC Test Circuit Design and Implement Based on JTAG

A Test Architecture for Test Reuse in SOC Design

A novel on-chip debug system with quick all-registers scan chain based on JTAG

A JTAG Standard-based Test Circuit Design for SOC System

An SW-HW Co-Design Debug Interface for SOCs Based on JTAG

A Method of Embedded Debug Interface Based on JTAG Protocol

An improved method for test chip design

SOC Testing Methodology and Practice

A Microprocessor Based SOC Built-In Test Scheme

An Improved Test Access Mechanism Structure and Optimization Technique in System-on-chip

Design of An Extended On-chip Real Time Debug System

Design for HW/SW Co-Testing Based on FPGA

Eliminating Timing Errors Through Collaborative Design to Maximize the Throughput

Software- Based Self-Testing Methodology for Embedded Processor Cores

Effective Design Method to Reduce SCAN Test Application Time of SOC's

Concurrent Core Test for SOC Using Shared Test Set and Scan Chain Disable

A Parallel JTAG-based Debugging and Selection Scheme for Multi-core Digital Signal Processors

An Overview of JTAG Technology: Development and Application