Effects of Unintended Dopants on I-V Characteristics of the Double-Gate MOSFETs, a Simulation Study

Li Pei-Cheng,Mei Guang-Hui,Hu Guang-Xi,Wang Ling-Li,Liu Ran,Tang Ting-Ao
DOI: https://doi.org/10.1109/asicon.2011.6157310
2012-01-01
Communications in Theoretical Physics
Abstract:In this paper, we study the effects of an unintended dopant in the channel on the current-voltage characteristics of a Double-Gate (DG) Metal-Oxide-Semiconductor Field-Effect Transistor (MOSFET). Non-Equilibrium Green'sFunction (NEGF) approach is used. A quantum transport model to calculate the drain current is presented and subthreshold swing and drain induced barrier lowering (DIBL) effect are studied.
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