A novel built-in CMOS sensor for on-line thermal monitoring of VLSI circuits

Zhang Sheng,Zhou Runde
DOI: https://doi.org/10.1109/ICASIC.2003.1277466
2003-01-01
Abstract:Built-in temperature sensors increase the system reliability by predicting eventual faults caused by excessive chip temperatures. In this paper, a novel temperature sensor is presented, developed by the authors especially for the purpose of thermal monitoring of VLSI chips. This proposed sensor require very small silicon area and power consumption and the accuracy is in the order of 0.8°C.
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