Investigation of single quantum Hall device of resistance standard in NIM

qing zhong,jinjin li,jianting zhao,mengke zhao,xueshen wang,yunfeng lu,yuan zhong
DOI: https://doi.org/10.1109/CPEM.2014.6898500
2014-01-01
Abstract:We report in CPEM 2014 our latest results of the study of single quantum Hall device for the resistance standard in National Institute of Metrology, China (NIM). Experimental results indicate quantized Hall devices with satisfied longitudinal resistance, low contact resistance, and good breakdown current are obtained. Comparison of the quantum Hall resistance to a precise transfer resistance standard is made using direct current comparator (DCC). A measurement resolution on the level of 10-7 is obtained which is limited by the DCC resolution.
What problem does this paper attempt to address?