Behavior of the contacts of Quantum Hall Effect devices at high currents : an electronic thermometer

Y. M. Meziani,C. Chaubet,S. Bonifacie,B. Jouault,A. Raymond,W. Poirier,F. Piquemal
DOI: https://doi.org/10.1063/1.1748853
2003-07-30
Abstract:This paper reports on an experimental study of the contact resistance of Hall bars in the Quantum Hall Effect regime while increasing the current through the sample. These measurements involve also the longitudinal resistance and they have been always performed before the breakdown of the Quantum Hall Effect. Our investigations are restricted to the $i=2$ plateau which is used in all metrological measurements of the von Klitzing constant $R_K$. A particular care has been taken concerning the configuration of the measurement. Four configurations were used for each Hall bar by reversing the current and the magnetic field polarities. Several samples with different width have been studied and we observed that the critical current for the contact resistance increases with the width of the Hall bar as previously observed for the critical current of the longitudinal resistance. The critical currents exhibit either a linear or a sublinear increase. All our observations are interpreted in the current understanding of the Quantum hall effect brekdown. Our analysis suggests that a heated region appears at the current contact, develops and then extends in the whole sample while increasing the current. Consequently, we propose to use the contact resistance as an electronic thermometer for the Hall fluid.
Mesoscale and Nanoscale Physics
What problem does this paper attempt to address?
The problem that this paper attempts to solve is the behavior of contact resistance when the current through the sample increases in a Quantum Hall Effect (QHE) device. Specifically, the authors focus on how the contact resistance of the Hall bar changes under high - current conditions and explore the impact of these changes on the Quantum Hall Effect. ### Main problems: 1. **Increase in contact resistance**: As the current increases, the contact resistance suddenly increases far below the critical current at which the Quantum Hall Effect breaks down. This phenomenon limits the current intensity that can be injected into the Hall bar, thus affecting the measurement accuracy. 2. **Change in longitudinal resistance**: In addition to the contact resistance, the longitudinal resistance also shows exponential growth as the current increases. This growth further affects the quantization characteristics of the system. 3. **Formation of heating area**: It has been experimentally observed that a heating area is formed near the current contacts, and this area expands as the current increases and eventually affects the entire sample. ### Research background: - **Quantum Hall Effect**: Under low temperature and strong magnetic field, the Hall resistance \(R_H\) of two - dimensional electron gas will be quantized into integer or fractional multiples of \(\frac{h}{e^2}\). - **von Klitzing constant \(R_K\)**: It is the standard resistance value used in metrology, defined as \(R_K=\frac{h}{e^2}\approx25812.807\ \Omega\). - **Current limitation**: In order to ensure measurement accuracy, the current intensity through the sample must be limited to avoid the increase of longitudinal resistance \(R_{xx}\), so as to maintain the accuracy of Hall resistance \(R_H\). ### Research methods: - **Experimental design**: Four different measurement configurations are used to study Hall bar samples of different widths by reversing the polarity of current and magnetic field. - **Data collection**: Measure the contact resistance \(V_c\) and longitudinal voltage \(V_{xx}\), and determine their relationship with the change of current. - **Data analysis**: Analyze the critical currents \(I_c\) and \(I_b\) of contact resistance and longitudinal resistance, and fit the relationship with the sample width \(W\). ### Key findings: - **Critical current \(I_c\) of contact resistance** increases linearly with the increase of Hall bar width \(W\). - **Critical current \(I_b\) of longitudinal resistance** shows a sub - linear increasing trend with the increase of width \(W\). - **Heating area**: The experimental results show that a heating area is formed near the current contacts, and the expansion of this area leads to the sudden increase of contact resistance. ### Conclusion: The authors propose that the contact resistance can be used as an electronic thermometer to monitor the temperature change of Hall fluid. This finding helps to further understand the breakdown mechanism of the Quantum Hall Effect and provides a new measurement method for future experiments. ### Formula summary: - von Klitzing constant: \[R_K = \frac{h}{e^2}\] - Relationship between critical current of contact resistance and width: \[I_c\propto W\] - Relationship between critical current of longitudinal resistance and width: \[I_b\propto\log\left(\frac{W}{W_0}\right)\] Through these studies, the authors hope to provide theoretical support and technical means for the accurate measurement of the Quantum Hall Effect.