Fabrication and Testing of Solution-Processed Carbon Nanotube Thin Film Transistor

Xun Yi,Liang Fang,Yaqing Chi,Bingcai Sui
DOI: https://doi.org/10.1109/infoseee.2014.6947855
2014-01-01
Abstract:We described fabrication and testing of solution-processed SWCNT TFTs. A back-gated TFT test structure was fabricated by drop-coating SWCNT solution on SiO2 surface with Au electrodes. Output characteristic and switching characteristic were measured and analyzed. Over 4 decades' on/off ratio was obtained by using drop-coating at room temperature without any further optimization. Although we use a back-gated test structure, gate leak current was estimated at the level of picoampere. The resultant mobility level was 2×10-3 cm2 V-1s-1, which is potential for future applications.
What problem does this paper attempt to address?