Abstract:With the development of nanotechnology in recent years, many researchers have focused on the development of nanomaterials and nanostructures such as nanowires. To apply these nanomaterials and nanostructures into nanodevices, there are great needs of the quantitative measurement of electrical properties of materials in an infinitesimal area. Recently, it has been reported that the microwave gives an effect to an interatomic force in local area among materials. Therefore, it is thought that an identification of materials and an evaluation of electrical characteristics become possible by clarifying the relation between microwave and interatomic force. Therefore, we investigated interatomic force under the tip of probe by focusing on the force-distance curve measurement using microwave atomic force microscopy (M-AFM) as the first step. This paper describes the method and the results of the force-distance curve measurement on the sample of Au, Si, and glass. Results of this experiment indicate actually that the effect of microwave is large in material which has high electric conductivity.

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