Abstract:Abstract Background Transmission electron microscopy (TEM) remains an important technique to investigate the size, shape and surface characteristics of particles at the nanometer scale. Resulting micrographs are two dimensional projections of objects and their interpretation can be difficult. Recently, electron tomography (ET) is increasingly used to reveal the morphology of nanomaterials (NM) in 3D. In this study, we examined the feasibility to visualize and measure silica and gold NM in suspension using conventional bright field electron tomography. Results The general morphology of gold and silica NM was visualized in 3D by conventional TEM in bright field mode. In orthoslices of the examined NM the surface features of a NM could be seen and measured without interference of higher or lower lying structures inherent to conventional TEM. Segmentation by isosurface rendering allowed visualizing the 3D information of an electron tomographic reconstruction in greater detail than digital slicing. From the 3D reconstructions, the surface area and the volume of the examined NM could be estimated directly and the volume-specific surface area (VSSA) was calculated. The mean VSSA of all examined NM was significantly larger than the threshold of 60 m 2 /cm 3 . The high correlation between the measured values of area and volume gold nanoparticles with a known spherical morphology and the areas and volumes calculated from the equivalent circle diameter (ECD) of projected nanoparticles (NP) indicates that the values measured from electron tomographic reconstructions are valid for these gold particles. Conclusion The characterization and definition of the examined gold and silica NM can benefit from application of conventional bright field electron tomography: the NM can be visualized in 3D, while surface features and the VSSA can be measured.

Note: Direct Measurement Of The Point-To-Point Resolution For Microns-Thick Specimens In The Ultrahigh-Voltage Electron Microscope

Image Quality of Microns-Thick Specimens in the Ultra-High Voltage Electron Microscope.

Electron Tomographic Resolution of Microns-Thick Specimens in the Ultrahigh Voltage Electron Microscope.

Multiple Scattering Effects of MeV Electrons in Very Thick Amorphous Specimens

The point spread function assessment of MeV electron imaging quality for thick specimens

Electron tomography at 2.4 Å resolution

Tomographic Imaging Ultra-Thick Specimens with Nanometer Resolution

High-Resolution Transmission Electron Microscopy Imaging Of Carbon Nanostructures

Numerical Studies on Sub-10 Nanometer Resolution Imaging in Electrostatic Force Microscopy

Determination of the volume-specific surface area by using transmission electron tomography for characterization and definition of nanomaterials

Electron Tomography on Micrometer-Thick Specimens with Nanometer Resolution

Method for examining solid specimens with improved resolution in the scanning electron microscope (SEM)

Toward High-Resolution Low-Voltage SEM

Theoretical Study of the Ultimate Resolution of SEM

Probing Light Atoms at Subnanometer Resolution: Realization of Scanning Transmission Electron Microscope Holography

A Review of Sample Thickness Effects on High-Resolution Transmission Electron Microscopy Imaging

Atomic Resolution Imaging of YAlO3: Ce in the Chromatic and Spherical Aberration Corrected PICO Electron Microscope

Determining the Resolution Limits of Electron-Beam Lithography: Direct Measurement of the Point-Spread Function.

Probing Transient Localized Electromagnetic Fields Using Low-Energy Point-Projection Electron Microscopy

Electron ptychography of 2D materials to deep sub-ångström resolution

A Resolution Study for Electrostatic Force Microscopy on Bimetallic Samples Using the Boundary Element Method