Abstract:This article deals with the design of on-chip architectures for testing large system chips (SOCs) for manufacturing defects in a modular fashion. These architectures consist of wrappers and test access mechanisms (TAMs). For an SOC with specified parameters of modules and their tests, we design an architecture that minimizes the required tester vector memory depth and test application time. In this article, we formulate the test architecture design problems for both modules with fixed- and flexible-length scan chains, assuming the relevant module parameters and a maximal SOC TAM width are given. Subsequently, we derive a formulation for an architecture-independent lower bound for the SOC test time. We analyze three types of TAM under-utilization that make the theoretical lower bound unachievable in most practical architecture instances. We present a novel architecture-independent heuristic algorithm that effectively optimizes the test architecture for a given SOC. The algorithm efficiently determines the number of TAMs and their widths, the assignment of modules to TAMs, and the wrapper design per module. We show how this algorithm can be used for optimizing both test bus and TestRail architectures with either serial or parallel test schedules. Experimental results for the ITC'02 SOC Test Benchmarks show that, compared to manual best-effort engineering approaches, we can save up to 75% in test times, while compared to previously published algorithms, we obtain comparable or better test times at negligible compute time.

Flexible TAM-bus assignment method for solving SoC test scheduling problem

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Scheduling Optimization Techniques for FlexRay Using Constraint-Programming

An Improved Test Access Mechanism Structure and Optimization Technique in System-on-chip

Temporal task partitioning algorithm for dynamically reconfigurable systems

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Dual-Speed TAM Optimization of 3D SoCs for Mid-bond and Post-bond Testing

SOC test architecture design for efficient utilization of test bandwidth

Incremental Sequence Pair Generation Algorithm for SOC Test Scheduling

A Novel Testability-Oriented Data Path Scheduling Scheme in High-Level Synthesis

Test scheduling using test subsession partitioning

Test Access Mechanism Design and Test Controlling for Network-on-Chip.

Scheduling Tests for 3D Stacked Chips under Power Constraints

Integrated scheduling optimization of U-shaped automated container terminal under loading and unloading mode

An Effective Buffer Planning Algorithm for IP Based Fixed-Outline SOC Placement

Hierarchical SoC Testing Scheduling Based on the Ant Colony Algorithm

A Shuffle Frog-Leaping Algorithm for Test Scheduling of 2D/3D SoC

Test Scheduling for IP Cores Optimization Based on the Genetic Algorithm

Test Wrapper and Test Access Mechanism Co-optimization for SoC Based on Ant Colony Algorithm

Parallel Testing Based on Test Subsession Partitioning