Scanning Tunneling Microscopy Observation of Surface Superstructures During the Growth of in on In/Si(111) Surface

Maojie Xu,Xiao-Ming Dou,Jin-Feng Jia,Qi-Kun Xue,Yafei Zhang,Arifumi Okada,Shoji Yoshida,Hidemi Shigekawa
DOI: https://doi.org/10.1016/j.tsf.2011.06.099
IF: 2.1
2011-01-01
Thin Solid Films
Abstract:Surface superstructures are studied with scanning tunneling microscopy during the growth of In on In/Si(111). On the inhomogeneous substrate of Si(111) 4×1/3×3-In coexisting surface, the deposition of 1.5 monolayer (ML) In at about 0°C leads to 7×3 reconstruction on 3×3 surface and the formation of one-dimensional nanowires on 4×1 surface (1.0ML=7.8×1014atoms/cm2). Subsequent deposition of In at −100°C gives rise to the appearance of a hexagonal superstructure with 37×43 periodicity on 7×3 reconstructed surface, while self-alignment of In dots along one-dimensional nanowires is observed on the initial 4×1 surface. On Si(111) 3×3-In surface, the growth of 2.5ML In at about −100°C yields 6×6 superstructure. The strain in the epitaxial In thin films provides a driving force for the formation of self-organized surface structures.
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