Single Crystalline Tm2O3 Films Grown on Si (001) by Atomic Oxygen Assisted Molecular Beam Epitaxy

T. Ji,J. Cui,Z. B. Fang,T. X. Nie,Y. L. Fan,X. L. Li,Q. He,Z. M. Jiang
DOI: https://doi.org/10.1016/j.jcrysgro.2011.02.038
IF: 1.8
2011-01-01
Journal of Crystal Growth
Abstract:Ultrathin single crystalline Tm2O3 films have been grown on Si (001) substrate by molecular beam epitaxy using metallic Tm source at a substrate temperature of 600°C and an atomic oxygen ambient pressure of 2×10−7Torr. The epitaxial relationship between the Tm2O3 films and the Si substrates is Tm2O3 (110)//Si (001), Tm2O3 [001]//Si [110] or Tm2O3 [1−10]//Si [110]. Higher oxygen pressure would change the preferential growth orientations from (110) to (111) with the growth mode from epitaxy to non-epitaxy. After annealing in O2 ambience at 450°C for 30min, the single crystalline films exhibit a dielectric constant of 10.8 and a leakage current density of 2×10−3A/cm2 at an electric field of 1MVcm−1 with an equivalent oxide thickness of 2.3nm. Small angle X-ray reflectivity measurements were carried out to investigate the annealing effect in the improvement of electrical properties of the films.
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