MOCVD preparation and properties of ZnO and Ni-doped ZnO films

WANG Hui,WANG Jin,ZHAO Yang,ZHAO Long,Wang Zhao,Zhifeng Shi,Xiaochuan Xia,MA Yan,Guotong Du,Xin Dong
2011-01-01
Abstract:ZnO and ZnO:Ni films were prepared by metal organic chemical vapor deposition method, and their structure and physical properties were studied. The surface morphologies and crystal structures of the films were analyzed by scanning electron microscope(SEM) and X-ray diffraction(XRD) technique. The results showed that doped Ni can affect the surface morphology and the crystal structure of the ZnO film greatly. The optical characteristic was performed by UV-Vis spectrophotometer. Average transmittance of the ZnO:Ni film was determined to be about 90% in the visible region, which is larger than that(85%) of the undoped ZnO film. The electrical characteristics were performed by Hall system. Resistivity of the ZnO:Ni film was larger than that of the undoped ZnO film. Carrier concentration of the ZnO:Ni film was much less than that of the undoped ZnO film. It was resulted from that Ni reduces the intrinsic donor defect concentration of ZnO film, and this avoids the strong self-compensate effect. Therefore, it is easier to acquire the p-type film by this Way.
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