Controlled Deformation of Si3N4nanopores Using Focused Electron Beam in a Transmission Electron Microscope

Song Liu,Qing Zhao,Qingtao Li,Hengbin Zhang,Liping You,Jingmin Zhang,Dapeng Yu
DOI: https://doi.org/10.1088/0957-4484/22/11/115302
IF: 3.5
2011-01-01
Nanotechnology
Abstract:The controllable deformation of nanopores was realized by moving a convergent electron beam in a high-resolution transmission electron microscope. Nanostructures with the desired geometries were successfully fabricated from the original nanopores in 100 nm-thick and 260 nm-thick Si(3)N(4) membranes. The formation dynamics is a competition process between the knock-on effect of the high-energy electron beam and surface tension driven shrinkage. This approach can be used to finely tune critical dimensions and deform nanopores to particular desired geometries with single-nanometer precision, which offers substantial opportunities in flexibly fabricating nanostructures for various applications such as nanoelectronics and nanofluidics.
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