Experimental analysis of charge transfer efficiency degradation of charge coupled devices induced by proton irradiation

Wang Zu-Jun,Tang Ben-Qi,Xiao Zhi-Gang,Liu Min-Bo,Huang Shao-Yan,Yong Zhang
DOI: https://doi.org/10.7498/aps.59.4136
2010-01-01
Abstract:The experiments on charge coupled devices (CCD) irradiated by protons were carried out. The charge transfer efficiency (CTE) of CCD was measured before and after proton radiation. The radiation damage mechanism of CTE degradation was analyzed. The CTE degradation induced by irradiation of protons of different energies was compared. The experimental results were explained by the theoretical analysis based on the calculation by radiation particle transport simulation software. © 2010 Chin. Phys. Soc.
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