Thickness-Dependent Structural And Magnetic Properties Of Bifeo3 Films Prepared By Metal Organic Decomposition Method

Fengzhen Huang,Xiaomei Lü,Weiwei Lin,Yi Kan,Junting Zhang,Qingdong Chen,Zhe Wang,Liben Li,Jinsong Zhu
DOI: https://doi.org/10.1063/1.3519986
IF: 4
2010-01-01
Applied Physics Letters
Abstract:Perovskite BiFeO3 films with various thicknesses were prepared on Pt/Ti/SiO2/Si substrates by metal organic decomposition method. It was found that, with the film thickness increasing from 35 to 120 nm, the grain and ferroelectric domain size slightly increased, while the saturation magnetization M-s abruptly decreased. For the further increase of film thickness, M-s decreased slowly and the magnetization of unit area exhibited a fluctuation behavior. Moreover, the magnetic anisotropy degenerated with the increase of film thickness. The possible causes for the thickness effects were discussed. (C) 2010 American Institute of Physics. [doi:10.1063/1.3519986]
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