Polarization Phase-Shifting Interference Microscopy For Ultra-Precision Surface Topography

W. Cheng,X. Chen,L. Zhou,X. Liu
DOI: https://doi.org/10.1117/12.885971
2010-01-01
Abstract:Phase-shifting interference microscopy is a very important technique for precision surface topography measurement. In this paper, polarization phase-shifting interference microscopy is proposed for ultra-precision surface topography measurement. The principle of the microscopy is described and analyzed in details, a system based on the principle is constructed, and series of experimental testing are conducted on the system. The experimental results show that the measurement accuracy is better than 1.5nm, and high accuracy is verified.
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