Abstract:Computer-Aided Design (CAD) tools are extensively used throughout all of the steps in a VLSI design flow. The physical design domain is one of the three domains that are conceptually abstracted in representing a VLSI design flow. This research work focuses on three areas in VLSI physical design domain: clock tree design and buffer insertion, interconnect model order reduction and LVS verification. First, an optimal buffer insertion for clock delay and skew minimization algorithm is developed based on the theory that the minimal clock delay can be obtained by equalizing derivatives of a convex function, and the minimal clock skew can be achieved by equalizing delay functions of different source-to-sink paths. Experimental results show that the presented algorithm achieves both minimal delay and skew in real clock tree design. Further, an automatic clock tree design algorithm is developed for realizing the pre-specified clock arrival time requirements that often occur in an IP block based design environment. In this proposed strategy, planar clock routing and buffer insertion are carried out simultaneously to minimize clock delay and skew, and a full waveform simulation is applied to ensure the signal integrity necessary for high-speed VLSI design. Second, an efficient balanced truncation realization algorithm is presented for interconnect model order reduction. This algorithm shows that there is no need to solve the whole Lyapunov equation for controllability and observability grammians before obtaining approximation to their predominant spaces, and a linear order reduction algorithm can be achieved by extending the O(n) Krylov Subspace Oblique Projection method. Finally, a unique LVS methodology is proposed for the verification of a quad-core microprocessor designed with a triple-well 90-nm CMOS technology. Due to the IP reuse, the standard LVS flow is incapable of handling the additional design complexity in verifying the LVS for the chip designed with multiple power domains. This proposed LVS strategy consists of two phases. The first phase involves verifying LVS at the block level as well as the full-chip level. The second phase aims at verifying the integrity of the multi-power-domain power grid. The proposed LVS methodology was successfully verified by real silicon.

Performance Robustness Analysis of VLSI Circuits with Process Variations Based on Kharitonov's Theorem

Worst case analysis for evaluating VLSI circuit performance bounds using an optimization method.

Worst Case Analysis of Linear Analog Circuit Performance Based on Kharitonov's Rectangle

Process Variation and Temperature-Aware Full Chip Oxide Breakdown Reliability Analysis.

Variation-aware gate sizing and clustering for post-silicon optimized circuits.

An Efficient Method for Evaluating Analog Circuit Performance Bounds Under Process Variations.

Design Time Body Bias Selection for Parametric Yield Improvement.

Process Variation and Temperature-Aware Reliability Management

Improving the Process-Variation Tolerance of Digital Circuits Using Gate Sizing and Statistical Techniques

Time-domain performance bound analysis for analog and interconnect circuits considering process variations

A novel approach to estimate the impact of analog circuit performance based on the small signal model under process variations

Statistical Reliability Analysis under Process Variation and Aging Effects

Variability-Aware Approximate Circuit Synthesis via Genetic Optimization

Analog circuit performance bound estimation based on extreme value theory

Variational Circuit Simulator Based On A Unified Methodology Using Arithmetic Over Taylor Polynomials

RobustAnalog: Fast Variation-Aware Analog Circuit Design Via Multi-task RL

Statistical Timing and Power Optimization of Architecture and Device for FPGAs

Modeling the Impact of Process Variation on Critical Charge Distribution

A Variation Aware High Level Synthesis Framework

Algorithms and Methodology in Physical Domain Optimization for High-Performance Vlsi Design

Performance Bound and Yield Analysis for Analog Circuits under Process Variations.