Abstract:In this paper, we propose a method based on deep neural networks for the statistical design of flip-flops, taking into account nonlinear performance constraints. Flip-flop design and manufacturing are influenced by random variations in the technological process, making deterministic design approaches inadequate for achieving high yields. The conventional yield maximization method using Monte Carlo (MC) simulation is a time-consuming process. Also, for many performance constraints, either there are no analytical formulations or if they exist, they are not sufficiently accurate to be used in circuit optimization. To address these challenges, we approximated the nonlinear constraints with linearized ones (polyhedral approximation) and performed a yield maximization process which was done by developing our first proposed method. Then in the second proposed method, we used deep neural networks to generate precise nonlinear closed-form models for circuit performance metrics and also replaced MC simulation with an analytical yield formula. The combination of these techniques significantly enhances the speed and accuracy of statistical circuit design by employing powerful gradient-based optimization methods that converge quickly to the optimal solution. Experimental results demonstrate that our proposed approach enables the design of circuits with various performance constraints under process variation, and achieves more optimum results with much fewer iterations and less CPU time compared to the conventional simulation-based yield maximization methods.

Performance Bound and Yield Analysis for Analog Circuits under Process Variations.

Design Time Body Bias Selection for Parametric Yield Improvement.

Time-domain performance bound analysis for analog and interconnect circuits considering process variations

An Efficient Method for Evaluating Analog Circuit Performance Bounds Under Process Variations.

An Efficient Yield Optimization Method for Analog Circuits Via Gaussian Process Classification and Varying-Sigma Sampling

Analog Circuit Yield Optimization Via Freeze–Thaw Bayesian Optimization Technique

Efficient Yield Optimization for Analog and SRAM Circuits Via Gaussian Process Regression and Adaptive Yield Estimation

Quickyield: An Efficient Global-Search Based Parametric Yield Estimation With Performance Constraints

Efficient Bayesian Yield Optimization Approach for Analog and SRAM Circuits

Bayesian Methods for the Yield Optimization of Analog and SRAM Circuits

A Yield-Enhanced Global Optimization Methodology for Analog Circuit Based on Extreme Value Theory

A Fast Non-Monte-Carlo Yield Analysis and Optimization by Stochastic Orthogonal Polynomials

C-Yes: an Efficient Parametric Yield Estimation Approach for Analog and Mixed-Signal Circuits Based on Multicorner-Multiperformance Correlations

Analog circuit performance bound estimation based on extreme value theory

Yield Optimization for Analog Circuits over Multiple Corners Via Bayesian Neural Networks: Enhancing Circuit Reliability under Environmental Variation

A Variation Aware High Level Synthesis Framework

Parametric Yield Driven Resource Binding In Behavioral Synthesis With Multi-V-Th/V-Dd Library

Parametric Yield-Driven Resource Binding in High-Level Synthesis with Multi-Vth/VddLibrary and Device Sizing

A novel approach to estimate the impact of analog circuit performance based on the small signal model under process variations

Worst case analysis for evaluating VLSI circuit performance bounds using an optimization method.

Yield Maximization of Flip-Flop Circuits Based on Deep Neural Network and Polyhedral Estimation of Nonlinear Constraints