Using Conductive Atomic Force Microscope on Carbon Nanotube Networks

Zhao Hua-Bo,Li Zhen,Li Rui,Zhang Zhao-Hui,Zhang Yan,Liu Yu,Li Yan
DOI: https://doi.org/10.7498/aps.58.8473
IF: 0.906
2009-01-01
Acta Physica Sinica
Abstract:Conductive atom force microscopy observations have been performed on carbon nanotube networks. The results indicate that within an imaging range of several tens of micrometers the resistance of a carbon nanotube is much smaller than the contact resistance between two crossed carbon nanotubes and so the potential difference hardly appears along a carbon nanotube if the carbon nanotube network is electrically biased. Besides, if several semiconducting carbon nanotubes wind into a bundle, they tend to appear like metallic carbon nanotubes.
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