Oxygen Defect Induced Photoluminescence of HfO2 Thin Films

Jie Ni,Qin Zhou,Zhengcao Li,Zhengjun Zhang
DOI: https://doi.org/10.1063/1.2952288
IF: 4
2008-01-01
Applied Physics Letters
Abstract:Amorphous HfO2 films prepared by e-beam deposition exhibited room-temperature photoluminescence (PL) in the visible range, i.e., at ∼620 and 700nm, due to oxygen vacancies involved during deposition. This PL can be enhanced by two orders in intensity by crystallizing the amorphous films in flowing argon, where a large amount of oxygen vacancies were introduced, and can be diminished by removal of the oxygen vacancies by annealing HfO2 films in oxygen. This study could help understand the defect-property relationship and provides ways to tune the PL property of HfO2 films.
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