Reversible Charge Injection in Antiferroelectric Thin Films

A. Q. Jiang,T. A. Tang,S. Corkovic,Q. Zhang
DOI: https://doi.org/10.1063/1.3039073
IF: 4
2008-01-01
Applied Physics Letters
Abstract:High-energy storage antiferroelectric capacitors operated in a high speed require the quick release of stored charges after the removal of the electrical field accompanying ferroelectric-to-antiferroelectric phase transition. However, the phase-transition time can vary from a few nanoseconds to milliseconds due to the reversible charge injection into the film to temporally stabilize the high-field ferroelectric phase. The consequent theoretical modeling discloses the nearly Ohmic contact of an antiferroelectric Au/Cr/Pb(Zr0.95Ti0.05)O-3/Pt thin-film capacitor for the charge injection unlike the Schottky emission of a typical ferroelectric capacitor.
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