Pulse Injection Testing for LD Chip LIV Characteristics

范贤光,唐文彦,许文海
2008-01-01
Abstract:A method based on pulse injection was put forward to test the light-current-voltage(LIV) characteristics of laser diode(LD),and a new type of pulse measurement system was developed.The system provided pulsed current with continuously adjustable pulse width,pulse cycle and pulse amplitude to the measured LD,and collected the data generated from forward current,terminal voltage,backlight current and optical power of LDs under automatic power control or automatic current control,and then the LIV characteristics curves of LD were plotted based on above data,and the performance of LD was deduced.The pulsed current with low duty ratio effectively inhibited the temperature increasing in the active region of LD,which guaranteed the accuracy and reliability of the tests.Experimental results show that the stability of forward pulse current can reach 10-4,which meet the requirements for the LIV testing system,and its performance is superior to the DC testing system.
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