A New Method for Iddt Test of Cmos Circuits

Maowen Nie,Hongbing Xu,Jian Zhang
DOI: https://doi.org/10.1109/icccas.2008.4657982
2008-01-01
Abstract:Wavelet analysis, attracts much attention because of its effectiveness in signal process. As applications of wavelet analysis, wavelet packets and wavelet neural networks have been used for effectively exacting information in fault diagnosis. This paper presents a new method for exacting information from IDDT (Transient power supply current) and performing fault diagnosis. This method is based on singularity, Lipschitz exponents and multi-resolution analysis. Though it is easy and simple to implement, it is efficient. Experimental results for the compensated CMOS operational amplifier benchmark circuit show that it is effective for detecting and locating bridging faults and stuck-open-faults.
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