Abstract:The nonlinearity and tolerance of analog circuits always lead to the aliasing phenomenon among different fault classes, which greatly increases the difficulty of fault diagnosis, especially in scenarios with incipient faults and multiple faults. To solve the above issues, a dual-input model based on the multi-scale self-normalizing convolutional neural network with the squeeze and excitation module (SE-MSCNN) is proposed, which performs the end-to-end diagnosis by using the response signals of the circuits under test (CUTs). By embedding multi-scale information, the features on multiple receptive fields are aggregated to obtain the performance gain of the convolutional neural network (CNN) in terms of spatial dimensions. The attention mechanism is introduced to enhance useful features and inhibit useless ones. The stability and generalization capability of CNN are strengthened by introducing the self-normalizing property. In addition, a dual-input architecture is developed for the fault diagnosis model, which assists in constructing time-frequency fusion features to represent the essential information comprehensively. Three typical circuits are chosen as CUTs for fault diagnosis experiments. The results indicate that the dual-input model based on SE-MSCNN exhibits superior classification performance for incipient multiple faults compared with other excellent models recently proposed.

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