Analog circuit fault diagnosis approach using clustering and hierarchical decision SVM

Guoming Song,Houjun Wang,ShuYan Jiang,Liu Hong
2010-01-01
Abstract:When Support Vector Machine (SVM) is used for multi-fault diagnosis in analog circuits, the diagnosis accuracy and efficiency largely depend on the extension strategies for multi-classification. A hierarchical decision approach for fault diagnosis is proposed in this paper, which integrates fuzzy clustering and SVM algorithms to form multi-level binary tree SVM classifiers according to the distribution property of fault data sets. The structure of the tree is determined by iteratively dividing faulty class patterns into two clusters with two aspects of wavelet features. During the clustering process, F-measure is adopted for deciding fault subclass partition and feature selection on each tree node, which leads to maximize the separation margin between fault subclasses for SVM on that node so as to eliminate unclassifiable fault regions. As a result, the combination strategy of SVM is optimized. The presented method has been employed for filter circuit diagnosis with simplified classifier structure and satisfactory results have been achieved. The diagnosis precision and efficiency are greatly improved by our method in comparison with other conventional SVM approaches.
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