Finite element modeling of residual stress of Ti/TiAl multilayer composites prepared by electron beam physical vapor deposition technology

LiPing Shi,Yesheng Zhong,Jia Yu,Xiaodong He
DOI: https://doi.org/10.1166/jctn.2008.857
2008-01-01
Journal of Computational and Theoretical Nanoscience
Abstract:A numerical model on residual stress field in the Ti/TiAl multilayer composites prepared by Electron Beam Physical Vapor Deposition (EB-PVD) technology was investigated. A series of finite element analysis (FEA) programs were developed by APDL language of ANSYS to analyze the temperature field and thermal stress field of the Ti/TiAl multilayer composites. Transient analysis of temperature field and corresponding thermal stress field of the Ti/TiAl multilayer composites during the whole deposition process was carried and some meaningful results were obtained. It shows that the temperature changes violently with different deposition materials during the deposition process, while the trend of temperature distribution remains the same under different boundary condition. With increasing of thickness, the thermal stress takes on the increasing tendency. Also the calculation results of thermal stress field vary extraordinarily and stress concentration phenomena appear at the interface of different materials near the free edge.
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