Effect of the Charge-Coupled Image Device's Non-Uniformity by Neutrons

XIAO Zhi-gang,TANG Ben-qi,LI Jun-li,LIU Min-bo,ZHANG Yong,WANG Zu-jun,HUANG Shao-yan
DOI: https://doi.org/10.3969/j.issn.0258-0934.2007.04.027
2007-01-01
Abstract:The line CCD was tested after exposed to the fast neutron provided by the TRIGA reactor.The result showed that the non-uniformity of the line CCD was increased.The reason of the partial non-uniformity increased is because that the traps produced by the neutrons in CCD is nonuniform distribution.The reason of the whole non-uniformity increased is because that the charge transfer degradation is increased in CCD's transfer channel.
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