Noncatastrophic and Catastrophic Vacuum Breakdowns of Carbon Nanotube Film under Direct Current Conditions

X. H. Liang,S. Z. Deng,N. S. Xu,Jun Chen,N. Y. Huang,J. C. She
DOI: https://doi.org/10.1063/1.2437106
IF: 2.877
2007-01-01
Journal of Applied Physics
Abstract:The degradation and damage of carbon nanotube (CNT) films caused by field emission were investigated by carefully studying the effect of emission current density of different levels on the CNT film. It is found that the behavior of the vacuum breakdown of a CNT film is very different from a metal cathode. A critical emission current density may be identified, 500A∕m2, for example, for our present samples, below which the evaporation of CNT tips and breaking at defect sites of a group of CNTs of long length are the major causes of damage to the CNT film. When the emission current density is higher than the critical value, microarcing gives rise to significant catastrophic damage to the CNT film. A theoretical model proposed early for CNT vacuum breakdown was adapted to explain the present findings, which assumes thermal runaway as an initiating mechanism for CNT vacuum breakdown, taking into account the important role of Joule heating.
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