Mocvd Growth and Characteristics of High Quality Algan Used in the Dbr Structure of Ultraviolet Detector

Xie Zi-Li,Zhang Rong,Xiu Xiang-Qian,Han Ping,Liu Bin,Chen Lin,Yu Hui-Qiang,Jiang Ruo-Lian,Shi Yi,Zheng You-Dou
DOI: https://doi.org/10.7498/aps.56.6717
IF: 0.906
2007-01-01
Acta Physica Sinica
Abstract:High quality AlGaN materials used in the DBR structure of ultraviolet detector are grown under different growth conditions. The structure, composition and photographic characteristics are determined by XRD, SEM and AFM. The influence of the growth conditions on the characteristics of the AlGaN materials are discussed. The good performance of the DBR structure of ultraviolet detector is obtained.
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