Three-Dimensional Shape and Deformation Measurements Based on Fringe Projection Profilometry and Fluorescent Digital Image Correlation via a 3 Charge Coupled Device Camera
Wei Sun,Zhongda Xu,Xin Li,Zhenning Chen,Xinqiao Tang
DOI: https://doi.org/10.3390/s23156663
IF: 3.9
2023-07-26
Sensors
Abstract:We propose a novel hybrid FPP-DIC technique to measure an object's shape and deformation in 3D simultaneously by using a single 3CCD color camera, which captures the blue fringe patterns and red fluorescent speckles within the same image. Firstly, red fluorescent speckles were painted on the surface of the specimen. Subsequently, 12 computer-generated blue fringe patterns with a black background were projected onto the surface of the specimen using a DLP projector. Finally, both the reference and deformed images with three different frequencies and four shifted phases were captured using a 3CCD camera. This technique employed a three-chip configuration in which red–green–blue chips were discretely integrated in the 3CCD color camera sensor, rendering independent capture of RGB information possible. Measurement of out-of-plane displacement was carried out through the implementation of Fringe Projection Profilometry (FPP), whereas the in-plane displacement was evaluated using a 2D Digital Image Correlation (DIC) method by leveraging a telecentric-lens-based optical system. In comparison to the traditional FPP-DIC hybrid methodology, the present approach showed a lower incidence of crosstalk between the fringe patterns and speckle patterns while also offering a corrective for the coupling of the in-plane displacement and out-of-plane displacement. Experimental results for the in-plane cantilever beam and out-of-plane disk comparisons with the traditional 3D-DIC method indicated that the maximum discrepancy obtained between FPP-DIC and 3D-DIC was 0.7 μm and 0.034 mm with different magnifications, respectively, validating the effectiveness and precision of the novel proposed FPP-DIC method.
engineering, electrical & electronic,chemistry, analytical,instruments & instrumentation