Behavior of Implanted Strontium in Yttria-Stabilized Zirconia

S. Zhu,S. X. Wang,L. M. Wang,R. C. Ewing,X. T. Zu
DOI: https://doi.org/10.1063/1.2713127
IF: 4
2007-01-01
Applied Physics Letters
Abstract:Yttria-stabilized zirconia (YSZ) is one of the promising candidates for application in the inert matrix fuel. This letter presents the effects of fission product strontium incorporation in the YSZ microstructure. The strontium ions were implanted at room temperature to a dose of 1×1017ions∕cm2 and that was followed by subsequently annealing at 1000°C for 1–3h. Transmission electron microscopy (TEM) was utilized to characterize the microstructure evolution after the implantation and/or annealing. No amorphization was observed in the YSZ matrix with a damage level of 200dpa (displacements per atom). A layer of nanoscale strontium zirconate perovskite (SrZrO3) precipitates formed in strontium-ion implanted YSZ single crystals after the annealing. Cross-sectional TEM revealed the crystalline particles of ∼15nm in size and they are crystallographically highly oriented with the YSZ matrix. The orientation relationship between the matrix and the precipitates has been determined as ⟨011⟩YSZ‖⟨111⟩SrZrO3, {200}YSZ‖{110}SrZrO3. The interface is composed of misfit dislocations with b=1∕2⟨200⟩YSZ.
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