Abstract:The increasing power consumption during the chip testing process has become the bottleneck of chip production and testing for micro-nano VLSI circuits. Numerous low power design-for-testability (DfT) techniques have been proposed to deal with the test power problem, and segmented scan method was shown to be an efficient solution. We propose a new poweraware scan segment architecture, which can accurately control the power of shift and capture cycles at the same time. Since enabling only a subset of scan flip-flops to capture test responses in one cycle compromises the fault coverage, we propose a new method to reduce the fault coverage loss. First, we use a more accurate notion, spoiled nodes, instead of violation edges used in previous works to analyse the ependency of flip-flops, then we use simulated annealing(SA) mechanism to find the best combination of these flip-flops while considering the clock trees' impact. To the best of our knowledge, this is the first work to make shift and capture power in a controllable way with minimum fault coverage loss, small test-data volume and no extra hardware overhead for at-speed transition fault test. Extensive experiments have been performed on reference circuit ISCAS89 and IWLS2005 to verify the effectiveness of the proposed method.

A novel approach to drastic test data compression for multiple scan designs

A New Test Data Compression Scheme for Multi-scan Designs.

Improved Data Compression Scheme for Multi-Scan Designs

Selective Test Response Collection for Low-Power Scan Testing with Well-Compressed Test Data

Scan Flip-Flop Grouping to Compress Test Data and Compact Test Responses for Launch-on-Capture Delay Testing

A Compressive-sensing based Testing Vehicle for 3D TSV Pre-bond and Post-bond Testing Data.

An Efficient Compatibility-Based Test Data Compression and Its Decoder Architecture.

Test Data Compression for System-on-Chip Using Advanced Frequency-Directed Run-Length(AFDR) Codes

Scan Testing for Complete Coverage of Path Delay Faults with Reduced Test Data Volume, Test Application Time, and Hardware Cost

Compact Test Generation with an Influence Input Measure for Launch-On-Capture Transition Fault Testing

RunBasedReordering: A Novel Approach for Test Data Compression and Scan Power

Low-Power Scan Testing for Test Data Compression Using a Routing-Driven Scan Architecture

A new test data compression/decompression scheme to reduce SOC test time

A Power Efficient Test Data Compression Method for SoC Using Alternating Statistical Run-Length Coding

Test data compression using extended frequency-directed run length code based on compatibility

Reconfigured Scan Forest For Test Application Cost, Test Data Volume, And Test Power Reduction

A Power Efficient Test Data Compression Method on Count Compatible PRL Coding

Design for Cost Effective Scan Testing by Reconfiguring Scan Flip-Flops

Compression-aware Capture Power Reduction for At-Speed Testing

Compression Method Based on Test Vector Compatibility

A Novel Scan Segmentation Design for Power Controllability and Reduction in At-Speed Test.