Dynamic measuring method of filament by single-pointed source projection

Su Haitao,Yang Shiyuan,Dong Hua,Xu Bo
DOI: https://doi.org/10.3321/j.issn:0254-3087.2006.z2.020
2006-01-01
Abstract:The undulation of filament diameter impacts the quality of correlative products. The filament diameter usually be measured by means of photoelectricity energy, laser scanning, laser diffraction and projection imaging. A bi-lamp-house projection method was proposed by zhao Bin etc. , which measures 0. 1~1. 0mm diameter filament by using birefringent-crystal. A new method is proposed in this paper. It makes a semiconductor laser lamp-house into two bunches of light by Fresnel biprism. The two bunches of light are projected onto filament and then detected by CCD. Thus, the connection expression are obtained. The accuracy of this method is much higher due to the magnified projection. The complex and undulate problems of dynamic quality monitoring are solved.
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