Theory Study of a New Nanometrology Grating

Xiushui Ma,Yetai Fei,Xiaohuai Chen,Jing Zhao
DOI: https://doi.org/10.3321/j.issn:0254-3087.2006.02.012
2006-01-01
Abstract:In order to develop metrological grating with nanomeasurement precision, which has simple structure, high performance on anti-interfere, the measurement principle of nanomeasurement precision grating is analyzed based on two times' Moiré fringe, its resolution can achieve 5.40 × 10-10 m, and the measurement precision can achieve nanometer through simulated calculation. Furthermore, it discusses the effects of two times'Moiré fringe when the indicator grating and the scales grating are not parallel.
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