Ultraviolet Photoluminescence from 3C-Sic Nanorods

Ligong Zhang,Weiyou Yang,Hua Jin,Zhuhong Zheng,Zhipeng Xie,Hezhuo Miao,Linan An
DOI: https://doi.org/10.1063/1.2358313
IF: 4
2006-01-01
Applied Physics Letters
Abstract:An intensive sharp photoluminescence at 3.3eV is observed from single-crystal 3C-SiC nanorods. Structural characterization reveals that the nanorods contain a fairly large amount of threefold stacking faults. We tentatively attribute the emission to these stalking faults, which structurally resemble 6H-SiC nano-layers of 1.5nm embedded in a 3C-SiC matrix. The emission mechanism is discussed in terms of spontaneous polarization at the stacking faults.
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