Abstract:Indium-tin-oxide (ITO) coated glass has been widely used as a hole injection electrode for organic light-emitting devices (OLEDs), but the work function of ITO film usually mismatches the highest occupied molecular orbital (HOMO) of the hole transport materials. Copper phthalocyanine (CuPc) has been used as a hole injection buffer to enhance the hole injection from ITO to the hole transport layer. A thin CuPc layer was thermally evaporated onto the ITO-coated glass substrate, and the surface and interface electron states of the CuPc/ITO close contact were measured and analyzed by X-ray photoelectron spectroscopy (XPS) technology. Results show that, in CuPc molecule, copper atom has a valence of +2 and interacts with nitrogen atoms through coordinate bonds. There are two kinds of carbon atoms: eight carbon atoms bonding with two nitrogen atoms and other 24 carbon atoms with an aromatic hydrocarbon character. The nitrogen atoms are also in two kinds of chemical environment: four nitrogen atoms only bond with two carbon atoms forming C-N=C bonds, and other four nitrogen atoms not only bond with carbon atoms but also bond with copper atom through coordinate bonds. Argon ion beam sputtering was used to study the interface characteristics of the CuPc/ITO contact. As sputtering time increases, the peaks of C 1s and N 1s spectra gradually become weaker, the peaks of Cu 2p, O 1s, In 3d and Sn 3d spectra get stronger. The core-levels of C 1s, N 1s, O 1s, In 3d and Sn 3d spectra all have chemical shifts towards higher or lower binding energy, but their behavior are different.

The XPS Investigation on the PC Films Irradiated by MeV Cn+ (n = 1–5) Cluster Ions

Study of absorption spectra of PC films irradiated by MeV C ions and C2+ cluster ions

Damage cross-section of carbon cluster ions Cn + (n = 1-5) collision with polycarbonate

The investigation of energy loss and damage in polycarbonate induced by MeV carbon clusters

Investigation On The Orderly Growth Of Thick Zinc Phthalocyanine Films On Ag(100) Surface

Etching Characteristics for Tracks of Carbon Cluster Ions in Polycarbonate

X-ray photoelectron spectroscopy of KrF laser-irradiated polycarbonate films

Irradiation Effects In Polycarbonate Induced By 2.1 Gevkr Ions

200 Kev Xe+ Ions Irradiation Effects on Zr–Ti Binary Films

Investigation into the Characteristics of A-C:H Films Irradiated by Electron Beam

Investigation on CR39 implanted by Cn+ (n=1- 5) cluster ions

XPS Studies of Charging Effect Induced by X-ray Irradiation on Amorphous SiO2 Thin Films

Effects of Atomic Oxygen Irradiation on the Surface Properties of Phenolphthalein Poly(ether Sulfone)

Effects of 90 keV proton irradiation on chemical structure of Kapton H film

Investigation on CR39 Implanted Byc_n~+(n=1-5)Cluster Ions

Investigation into the Characteristics of A-C: H Films Radiated by an Electron Beam

Structural Study of 12 MeV Electron Irradiated Polypropylene by X-ray Diffraction

Structural Stability of C60 Films under the Bombardment of 1.95 GeV Kr Ions

[Surface and interface analysis for copper phthalocyanine (CuPc) and indium-tin-oxide (ITO) using X-ray photoelectron spectroscopy (XPS)]

Changes in Chemical Structure and Optical Properties of Polyimide Films Induced by Ion Bombardment

Evolution of optical properties and molecular structure of PCBM films under proton irradiation