Development of Step Height Measurement

JIANG Tian-gang,LI Yan,ZHANG Shu-lian
DOI: https://doi.org/10.3321/j.issn:1002-1582.2006.01.012
2006-01-01
Optical Technique
Abstract:Measurement of step height is one of the new international comparisons in nano metrology.Nowadays more extended range is required while the precision of measurement tends to be in nanograde.Several non contact optical methods are introduced in brief and the absolute distance interferometry with diode laser is emphasized hereinto.After comparing every method by measuring principle,resolution and measurement range,a CSWC ADI system was conceived with tunable diode laser to measure the step height in nanometer scale,and the theoretic uncertainty of the experiment was analyzed.Then the conclusion is drawn.
What problem does this paper attempt to address?