Study on the Performance of Phase-Shifter in the MEMS Microscopic Interferometric Measuring System

GUO Tong,HU Chun-guang,CHEN Jin-ping,FU Xing,HU Xiao-tang
DOI: https://doi.org/10.3969/j.issn.1004-1699.2006.05.050
2006-01-01
Abstract:Microscopic interferometry is a popular measurement method used in high accuracy surface characterization, where the phase shifter performance plays an important role in the accuracy of the system. The main error sources of the PZT phase shifter including hysteresis, nonlinearity and creep are analyzed. The open loop phase shifter is calibrated. Experiments are done on the 44nm step standard which is calibrated by NIST in the open loop and close loop. These show the measurement accuracy in these two conditions. Mean values of 10 measurements are 41.34 nm and 43.24 nm respectively, the standard deviation values are 2.08 nm and 0.41 nm respectively.
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