Benchmark tests on conventional surface potential based charge-sheet models and the advanced PUNSIM development

Jin He,Yan Song,Xudong Niu,Ganggang Zhang,Xing Zhang,Ru Huang,Mansun Chan,Yangyuan Wang
2006-01-01
Abstract:This paper reports benchmark test results of some conventional surface potential-based models and PUNSIM development. The benchmark tests demonstrated that the conventional surface potential-based always exist some device physics, accuracy, and self-consistent issues for the inversion charge, channel current, surface potential prediction and the short-channel effect modeling. The advanced PUNSIM is developed to overcome drawbacks all mentioned above while aiming at fulfilling the features: physics based analytic solution of the surface potential; an accurate description of inversion charge; physics based channel current equation and calculation; Self-consistently modelling of shosrt-channel effects.
What problem does this paper attempt to address?