Study On Molecular Dynamics Simulation Of Tungsten Microelectrode Based On Single Discharge In Edm

Z. L. Wang,J. Z. Cui,G. H. Cao
2006-01-01
Abstract:In this paper, in order to understand the mechanism of the microelectrode self-sharpening phenomenon in single discharge, molecular dynamics (MD) computer simulation is carried out. From the simulation result we find that during tungsten microelectrode self-sharpening process, single atom removing and bulk atom cluster removing both exist. Electric field force is a key factor for microelectrode shape forming. Heating rate (pulse duration) influences the shape of microelectrode largely, a optimum conditions in pulse duration and discharge current exist for microelectrode self-sharpening depending on the thermal conductivity and diameter of electrode.
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