Suppressing of On-Chip Inductor Current Crowding by a Multi-Current-Path Method

Liu Ke,Jian Hongyan,Huang Chenling,Tang Zhangwen,Min Hao
DOI: https://doi.org/10.3969/j.issn.1674-4926.2006.09.036
2006-01-01
Abstract:From the view of the electromagnetic theory,we examine the current redistributions of an inductor.We conclude that metal with a small cross-section has a weak skin effect and that inductors with a smaller ratio of the turn width to the space between turns have a weak proximity effect.The inductors are fabricated in 0.35μm four-metal CMOS technology.A turn of the differential inductor is divided into multi-shunt tracks,which keep the symmetry of the two ports of the inductor.Compared with a single-current-path configuration,the multi-current-path inductor offers a 40% greater maximum quality factor and a narrower range of operating frequencies,which we interpret here in detail.
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