Abstract:Due to the nondestructive requirements of gem testing,evaluation of precious stones shows characteristics of science and uncertainty.Gemological application of X-ray Diffraction (XRD)is specialized,with its application mainly concentrated in three aspects:① Gemstone identification:phase identification of the monocrystalline gemstones and polycrystalline gemstones;origin of the gemstones;classification of the pleomorphic gem minerals.For example,according to the XRD patterns of microcrystalline cryptocrystalline quartz variants,different silica mineral phases of the chalcedony can be distinguished accurately;types of ‘Di’in bloodstone can be distinguished through the composition and content of clay mineral.②Research on crystal structure of the gem minerals:analysis of crystal chemistry of the monocrystalline gems with complex composition;situation of the substitution of mineral isomorphism;quality of the gem by using the degree of crystallinity.For example,through the c/a ratio in lattice parameters of beryl,aluminium octahedral isomorphism and the beryllium tetrahedral isomorphism can be distinguished.The relationship between the crystallinity calculated from XRD data and the quality of nephrite is close.③Development of gemological research technology:to monitor the process of gemstone optimization;to inspect the mineral crystal size, crystalline quality and internal stress during the synthetic process of gemstones;to research the artificial breeding technology based on the crystal structure of organic gemstones.Take the heat treatment process of spinel as example:magnesium irons moved from octahedral M—O to tetrahedral T—O,resulting in the bond length of M—O and T—O changing upon temperature and being reflected in the spinel color.During the synthesis process of topaz,XRD data shows that the structure of the formed fluorine topaz is similar to natural topaz at 770 -800℃.At 950℃ and 1000℃, the fluorine topaz is decomposed to corundum and mullite.XRD research in the gemological application began relatively recently in China.In other countries,application in gem identification,optimization and synthesis are relatively mature.There is still much room for the development of XRD when combined with other technologies such as the Scanning Electron Microscope and Proton Microprobe.

Structure Defects in Type Ⅰa Brown Diamonds by Polychromatic Synchrotron Radiation Topography

Study on Crystal Defects in Synthetic Diamond with Synchrotron Radiation X-ray Diffraction Topography

[Preliminary Study on the Unique Spectroscopic Characteristics of Natural and Synthetic Diamonds].

Gemological and Spectral Characteristics of HPHT Synthetic Rough Diamonds

Natural Diamond with Seed Crystal from Hunan Province and Its Study with Synchrotron Radiation X-Ray Diffraction Topography

Review on the Application of X-ray Diffraction in Gem Identification, Synthesis and Crystal Structure Research

Unraveling sources of emission heterogeneity in Silicon Vacancy color centers with cryo-cathodoluminescence microscopy

High-resolution three-dimensional imaging of topological textures in single-diamond networks

Observation Of Defects In A C3n4/Diamond/Si Structure By Infrared Light Scattering Tomography

Extended defects in natural diamonds: Atomic Force Microscopy investigation

Structural Transition and Migration of Incoherent Twin Boundary in Diamond

Corresponding relationship between characteristic birefringence, strain, and impurities in Zimbabwean mixed-habit diamonds revealed by mapping techniques

Structural peculiarities of single crystal diamond needles of nanometer thickness

Synchrotron Radiation X-ray Fluorescence Analysis of Trace Elements in Diamond

Structural defects and sp2 localization in CVD diamond

Structural stability of Pr-related defects in diamond and electronic structure single photon source: A first-principles study

Modeling of radiative emission from shallow color centers in single crystalline diamond

Small Bragg-plane slope errors revealed in synthetic diamond crystals

Sub-nanometer-scale Mapping of Crystal Orientation and Depth-Dependent Structure of Dislocation Cores in SrTiO3

Investigating the broom-like inclusions in type Ib diamond single crystal synthesized by high pressure high temperature

The early development of synchrotron white-beam X-ray topography analysis for crystal investigations at Pohang light source-II