Abstract:The functionality of materials is determined by their composition and microstructure, that is, the distribution and orientation of crystalline grains, grain boundaries and the defects within them. The characterisation of the material's microstructure is therefore critical for materials applications such as catalysis, energy storage and buildings. Until now, characterization techniques that map the distribution of grains, their orientation, and the presence of defects have either been limited to surface investigations, to spatial resolutions of a few hundred nanometres, or to systems of thickness around one hundred nanometres, thus requiring destructive sample preparation for measurements and preventing the study of system-representative volumes or the investigation of materials under operational conditions. Here, we present X-ray linear dichroic orientation tomography, a quantitative, non-invasive technique that allows for an intra- and inter-granular characterisation of extended polycrystalline and amorphous materials in three dimensions (3D). We present the detailed characterisation of a polycrystalline sample of vanadium pentoxide (V2O5), a key catalyst in the production of sulfuric acid. In addition to determining the nanoscale composition, we map the crystal orientation throughout the polycrystalline sample with 73 nm spatial resolution. We identify grains, as well as twist, tilt, and twin grain boundaries. We further observe the creation and annihilation of topological defects promoted by the presence of volume crystallographic defects in 3D. Our method's non-destructive and spectroscopic nature opens the door to in-operando combined chemical and microstructural investigations of functional materials, including energy and mechanical materials in existing industries, as well as quantum materials for future technologies.

Sub-nanometer-scale Mapping of Crystal Orientation and Depth-Dependent Structure of Dislocation Cores in SrTiO3

Wide-Field Spectral Super-Resolution Mapping of Optically Active Defects in Hexagonal Boron Nitride.

Aberration-corrected Z-contrast Imaging of SrTiO3 Dislocation Cores.

Sub-nanometer depth resolution and single dopant visualization achieved by tilt-coupled multislice electron ptychography

Atomic-Scale Measurement of Flexoelectric Polarization at SrTiO_{3} Dislocations.

Correlating 3D atomic defects and electronic properties of 2D materials with picometer precision.

X-ray Linear Dichroic Tomography of Crystallographic and Topological Defects

Correlating 3D Atomic Defects and Electronic Properties of 2D Materials with Picometer Precision

Defect Engineering for Nontrivial Multiferroic Orders in SrTiO3

In Situ Structural Dynamics of Atomic Defects in Tungsten Oxide

Deep sub-angstrom resolution imaging by electron ptychography with misorientation correction

Atomic-scale Structure Relaxation, Chemistry and Charge Distribution of Dislocation Cores in SrTiO3.

Atomic structure and chemistry of dislocation cores at low-angle tilt grain boundary in SrTiO 3 bicrystals

In Situ Three-Dimensional Electron Diffraction for Probing Structural Transformations of Single Nanocrystals

Single-defect phonons imaged by electron microscopy

Deep level defect spectroscopies of complex oxide surfaces and interfaces

Three-dimensional imaging of individual point defects using selective detection angles in annular dark field scanning transmission electron microscopy

Three-dimensional imaging of dislocation propagation during crystal growth and dissolution

Revealing nano-scale lattice distortions in implanted material with 3D Bragg ptychography

Imaging interstitial atoms with multislice electron ptychography

Deep Learning Enabled Strain Mapping of Single-Atom Defects in 2D Transition Metal Dichalcogenides with Sub-picometer Precision