Conceptual Framework for Dislocation-Modified Conductivity in Oxide Ceramics Deconvoluting Mesoscopic Structure, Core, and Space Charge Exemplified for SrTiO 3
Lukas Porz,Till Frömling,Atsutomo Nakamura,Ning Li,Ryohei Maruyama,Katsuyuki Matsunaga,Peng Gao,Hugh Simons,Christian Dietz,Marcus Rohnke,Jürgen Janek,Jürgen Rödel,Till Frömling,Jürgen Janek,Jürgen Rödel
DOI: https://doi.org/10.1021/acsnano.0c04491
IF: 17.1
2020-11-10
ACS Nano
Abstract:The introduction of dislocations is a recently proposed strategy to tailor the functional and especially the electrical properties of ceramics. While several works confirm a clear impact of dislocations on electrical conductivity, some studies raise concern in particular when expanding to dislocation arrangements beyond a geometrically tractable bicrystal interface. Moreover, the lack of a complete classification on pertinent dislocation characteristics complicates a systematic discussion and hampers the design of dislocation-modified electrical conductivity. We proceed by mechanically introducing dislocations with three different mesoscopic structures into the model material single-crystal SrTiO<sub>3</sub> and extensively characterizing them from both a mechanical as well as an electrical perspective. As a final result, a deconvolution of <i>mesoscopic structure, core structure,</i> and <i>space charge</i> enables us to obtain the complete picture of the effect of dislocations on functional properties, focusing here on electric properties.The Supporting Information is available free of charge at <a class="ext-link" href="/doi/10.1021/acsnano.0c04491?goto=supporting-info">https://pubs.acs.org/doi/10.1021/acsnano.0c04491</a>.A sketch of the ⟨100⟩{100} slip system, the experimental setup for microelectrode testing, features observed with dark-field X-ray microcopy and glide/climb dissociation of a dislocation are available. Furthermore, optical microcopy images showing annealing effects on dislocation structures and oxygen partial pressure-dependent conductivity data as well as further TEM images highlighting the orientation of dislocations are given. The evaluation of the ToF-SIMS data is described in detail including additional figures. (<a class="ext-link" href="/doi/suppl/10.1021/acsnano.0c04491/suppl_file/nn0c04491_si_001.pdf">PDF</a>)This article has not yet been cited by other publications.
materials science, multidisciplinary,chemistry, physical,nanoscience & nanotechnology