Synchrotron Radiation X-ray Fluorescence Analysis of Trace Elements in Diamond

Shan Qin
2012-01-01
Abstract:The trace elements in synthetic diamond samples and natural diamond samples from Hunan,Liaoning,and Shandong have been investigated by means of synchrotron radiation X-ray fluorescence.The results demonstrate that the fourth-period elements(except As,Ge,Kr and Br) and Pb are detected in the synthetic diamond.The contents of Fe,Co,Ni are relatively high attributed to the mixture of the catalyst during the high-temperature and high-pressure synthetic progress.Trace elements in the natural crystals of diamond are Ca,Ti,Cr,Mn,Fe,Co,Ni,Cu,Zn,W,Au and Pb,while their amount of corresponding trace elements is lower than those of the synthetic diamond crystals.Natural diamonds from different origins vary in the aspect of the kinds and the amount of the trace elements,which reflects that the mantle conditions are different and different melts or fluids from the environment are involved in growing diamond crystals.
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