High-Throughput X-Ray Characterization System For Combinatorial Materials Studies

Zl Luo,B Geng,J Bao,Ch Liu,Wh Liu,C Gao,Zg Liu,Xl Ding
DOI: https://doi.org/10.1063/1.2038147
IF: 1.6
2005-01-01
Review of Scientific Instruments
Abstract:We have developed a high-throughput x-ray characterization system, which can rapidly screen structure, composition and x-ray scintillation of combinatorial materials libraries using energy-dispersive x-ray diffraction, x-ray fluorescence, and x-ray photoluminescence. This system consists of an x-ray source, a polycapillary x-ray lens, one or two x-ray energy detectors, and a fiber optic spectrometer. A Windows-based software package was also developed to control the measurement system and data acquisition automatically. Examples are also demonstrated to show the applicability of this system. (c) 2005 American Institute of Physics.
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