Determination of Pressure Effect on the Melting Point Elevation of Al Nanoparticles Encapsulated in Al2o3 Without Epitaxial Interface

QS Mei,SC Wang,HT Cong,ZH Jin,K Lu
DOI: https://doi.org/10.1103/physrevb.70.125421
2004-01-01
Abstract:We report a quantitative measurement of the pressure effect on melting point elevation of encapsulated nanoparticles without epitaxial interfaces. By means of in situ x-ray diffraction, a substantial melting point elevation of about 15 K in encapsulated Al nanoparticles in Al2O3 shells without epitaxial interfaces was observed. Meanwhile, a pressure buildup of about 0.25 GPa on the Al nanoparticles was determined due to constraint of the rigid Al2O3 shell. The correlation between the measured pressure and melting point elevation in the present system verified that the observed melting point elevation is a pressure-induced phenomenon and the pressure effect on melting point for encapsulated nanoparticles follows the rule for bulk solids.
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