Crystallization Kinetics of Amorphous In44sb20te36 Phase-Change Optical Recording Films on A Nanosecond Scale

XR Zhang,M Wuttig
DOI: https://doi.org/10.1088/0256-307x/21/6/033
2004-01-01
Chinese Physics Letters
Abstract:We propose a simple method to investigate the crystallization kinetics of amorphous In44Sb20Te36 films on a nanosecond scale, based on local reflectivity measurements of the nanosecond laser-induced crystallization using a static tester. The pulse condition in terms of laser power and pulse width required for the onset of crystallization is established. Applying this pulse condition and Kissinger's analysis, an activation energy of 0.57eV is estimated for the crystallization. This value deviates substantially from the activation energy determined at lower sample temperatures where crystallization proceeds in a time scale of seconds rather than nanoseconds.
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